Published by the Foundation for Open Access Statistics Editors-in-chief: Bettina Grün, Torsten Hothorn, Rebecca Killick, Edzer Pebesma, Achim Zeileis    ISSN 1548-7660; CODEN JSSOBK
Authors: Matthew E. Elam, Kenneth E. Case, Jong-Min Kim
Title: Second Stage Short Run (X,vc) and (X,sc) Control Charts
Abstract: In their 1970 paper titled "Mean and Variance Control Chart Limits Based on a Small Number of Subgroups" (Journal of Quality Technology, Volume 2, Number 1, pp. 9-16), Yang and Hillier originally derived equations for calculating the factors required to determine second stage short run control limits for ) v,X c( and )s ,X( c charts. Two issues have restricted the applicability of this particular control chart methodology. These are the limited tabulated values of factors Yang and Hillier present and no example to illustrate the use of the methodology. This paper addresses the first issue by presenting a computer program that accurately calculates the factors regardless of the values of the required inputs. An example shows how to incorporate the methodology into a two stage short run control charting procedure. The computer program is available at

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DOI: 10.18637/jss.v009.i07

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Paper: Creative Commons Attribution 3.0 Unported License
Code: GNU General Public License (at least one of version 2 or version 3) or a GPL-compatible license.